Distributed pseudo random sequence control with universal polyno

Electricity: measuring and testing – Plural – automatically sequential tests

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371 27, G01R 3128, G06F 1100

Patent

active

048703460

ABSTRACT:
Simple polynomial function generators are used to generate pseudo random test patterns and perform signature analysis on a per pin basis in the control logic in LSI/VLSI test systems.

REFERENCES:
patent: 3924181 (1975-12-01), Alderson
patent: 4222514 (1980-09-01), Bass
patent: 4503536 (1985-03-01), Panzer
patent: 4519078 (1985-05-01), Komonytsky
patent: 4670877 (1987-06-01), Nishibe
patent: 4745355 (1988-05-01), Eichelberger et al.
patent: 4745603 (1988-05-01), Shedd

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