Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1987-09-14
1989-09-26
Strecker, Gerard R.
Electricity: measuring and testing
Plural, automatically sequential tests
371 27, G01R 3128, G06F 1100
Patent
active
048703460
ABSTRACT:
Simple polynomial function generators are used to generate pseudo random test patterns and perform signature analysis on a per pin basis in the control logic in LSI/VLSI test systems.
REFERENCES:
patent: 3924181 (1975-12-01), Alderson
patent: 4222514 (1980-09-01), Bass
patent: 4503536 (1985-03-01), Panzer
patent: 4519078 (1985-05-01), Komonytsky
patent: 4670877 (1987-06-01), Nishibe
patent: 4745355 (1988-05-01), Eichelberger et al.
patent: 4745603 (1988-05-01), Shedd
Mydill Marc R.
Powell Theo J.
Barndt B. Peter
Comfort James T.
Sharp Melvin
Strecker Gerard R.
Texas Instruments Incorporated
LandOfFree
Distributed pseudo random sequence control with universal polyno does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Distributed pseudo random sequence control with universal polyno, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Distributed pseudo random sequence control with universal polyno will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-189451