Distributed, load sharing power supply system for IC tester

Details Distributed, load sharing power supply system for IC tester Distributed, load sharing power supply system for IC tester

2006-05-30

2006-05-30

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

07053648

ABSTRACT:
An integrated circuit (IC) tester includes a set of power modules mounted in a test head, each contacting a device interface board (DIB). The DIB provides power paths for delivering an output current generate by each power module to a power input terminals of one or more IC devices under test (DUTs). Power modules that supply current to the same set of DUTs communicate with one another though conductive paths provided by the DIB to ensure that all power modules begin supplying load current to that set of DUTs at the same time and to ensure that all power modules supply substantially the same amount of load current to those DUTs.

REFERENCES:
patent: 5951705 (1999-09-01), Arkin et al.
patent: 6028439 (2000-02-01), Arkin et al.
patent: 6202186 (2001-03-01), Oonk
patent: 6476628 (2002-11-01), LeColst
patent: 6489797 (2002-12-01), MacDonald et al.

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