Distributed diode fault check

Details Distributed diode fault check Distributed diode fault check

2005-11-22

2005-11-22

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S762010, C340S514000, C340S635000, C340S650000

Reexamination Certificate

active

06967487

ABSTRACT:
A method and apparatus for testing for latent faults in the isolation devices of a system including redundant power supplies which supply power to one or more system units. A system controller is operable to perform a test cycle to perform the fault checks, which may including checks for short circuits and/or open circuits. The checks may be performed within a test cycle in which each of the isolation devices in the system is tested. The test cycle may be performed at regular intervals, the interval between each cycle being determinable by user input. In the event that a fault in one of the isolation devices is detected, the system controller may be operable to report the fault to an alarm system.

REFERENCES:
patent: 3679970 (1972-07-01), Winters et al.
patent: 5325062 (1994-06-01), Bachand et al.
patent: 6157308 (2000-12-01), Byers
patent: 6342791 (2002-01-01), Ichikawa et al.
patent: 6462667 (2002-10-01), Menard
patent: 0690542 (1999-09-01), None
patent: 2389471 (2003-12-01), None

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