Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2008-05-27
2008-05-27
Bella, Matthew C. (Department: 2624)
Image analysis
Pattern recognition
Template matching
Reexamination Certificate
active
07379598
ABSTRACT:
The invention provides methods and systems for performing a matching function between a first pattern and a second pattern. This technique involves creating a set of all distance measurements between pairs of points in the first pattern and all distance measurements between pairs of points in the second pattern. This set is then partitioned into subsets of nearly equal distance elements. Those subsets containing at least one element derived from each pattern determine possible line segment matches which are then analyzed mathematically to determine the partial transform that maps the associated points of the first pattern into the points of the second pattern. The resulting set of partial transforms is then reviewed to determine matched line segments between the two patterns.
REFERENCES:
patent: 4891762 (1990-01-01), Chotiros
patent: 6272231 (2001-08-01), Maurer et al.
patent: 6687402 (2004-02-01), Taycher et al.
Ahmad Aisha
Bella Matthew C.
Chu Randolph
The Johns Hopkins University
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