Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-04-22
1998-07-14
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 301, 356 309, 25055938, G01B 1100
Patent
active
057812691
ABSTRACT:
A light having a single wavelength which is emitted from a light emitting element comprising a light emitting diode, a semiconductor laser or the like is changed to a parallel light by a collimator lens. The parallel light emitted from the collimator lens which has been changed or is being changed to such a beam as to keep a small beam diameter for a long distance by a conical lens is irradiated on a surface of an object to be measured. The light diffused from the surface of the object to be measured is collected into a position detecting element by a condenser lens so that a distance on the surface of the object to be measured can be measured.
Hamano Seiji
Ito Masami
Nishii Kanji
Nomura Tsuyoshi
Evans F. L.
Matsushita Electric - Industrial Co., Ltd.
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