Distance measuring method and apparatus

Details Distance measuring method and apparatus Distance measuring method and apparatus

1994-03-01

1995-07-25

Pham, Hoa Q.

Optics: measuring and testing

By polarized light examination

With light attenuation

25055924, G01B 1124

Patent

active

054367271

ABSTRACT:
A distance measuring method and apparatus capable of achieving fast and precise measurement of distances to positions on the surface of a three-dimensional object. The measuring procedure comprises the steps of: calculating count values C.sub.1 and C.sub.2 indicative respectively of angle differences .theta..sub.1 and .theta..sub.2 of a scanning mirror where slit light reflected from a reference plane set at first, second and third positions S0, S1 and S2 is incident upon a predetermined one of sensing cells arranged on an image pickup plane; calculating a count value C.sub.x indicative of an angle difference between an angle .theta..sub.S2 of the scanning mirror where the slit light reflected from the reference plane at the third position thereof is incident upon the said cell on the image pickup plane, and another angle .theta..sub.SX of the scanning mirror where the slit light reflected from the surface of the object is incident upon the said cell on the image pickup plane; and executing a predetermined calculation to obtain the distance between the first position S0 and the object surface.

REFERENCES:
patent: 4158507 (1979-06-01), Himmel
patent: 4325639 (1982-04-01), Richter
patent: 4794262 (1988-12-01), Sato et al.
patent: 4936676 (1990-06-01), Stauffer
patent: 4982102 (1991-01-01), Inoue et al.
patent: 4993835 (1991-02-01), Inoue et al.
patent: 5022751 (1991-06-01), Howard

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