Semiconductor device manufacturing: process – Semiconductor substrate dicing – Beam lead formation
Reexamination Certificate
2005-02-04
2008-12-02
Louie, Wai-Sing (Department: 2814)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
Beam lead formation
C438S411000, C438S611000, C257S785000, C257SE23067
Reexamination Certificate
active
07459376
ABSTRACT:
A method of fabricating a semiconductor component includes providing a prefabricated frame that includes metal traces and lead-through contacts. A semiconductor chip is mounted into the prefabricated frame such that the semiconductor chip is embedded within a rim of the prefabricated frame. Contact regions on a surface of the semiconductor chip are electrically connected with the metal traces of the prefabricated frame such that the contact regions are electrically coupled to the lead-through contacts via the metal traces.
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Infineon - Technologies AG
Ingham John C
Louie Wai-Sing
Slater & Matsil L.L.P.
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