Disposable hard mask for photomask plasma etching

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S313000, C430S396000

Reexamination Certificate

active

06908716

ABSTRACT:
A method for creating a photomask which includes a layer of hard mask material the inclusion of which improves the uniformity of critical dimensions on the photomask by minimizing the affect of macro and micro loading. The method for producing the photomask of the instant invention includes two etching processes. The first etching process etches the layer of hard mask, and the second etching process etches the anti-reflective material and opaque material.

REFERENCES:
patent: 4178403 (1979-12-01), Sakurai et al.
patent: 4556608 (1985-12-01), Kaneki et al.
patent: 4720442 (1988-01-01), Shinkai et al.
patent: 5451543 (1995-09-01), Woo et al.
patent: 5460908 (1995-10-01), Reinberg
patent: 5482799 (1996-01-01), Isao et al.
patent: 5578402 (1996-11-01), Watanabe
patent: 5693568 (1997-12-01), Liu et al.
patent: 5725973 (1998-03-01), Han et al.
patent: 5756396 (1998-05-01), Lee et al.
patent: 5939227 (1999-08-01), Smith
patent: 5955222 (1999-09-01), Hibbs et al.
patent: 6472107 (2002-10-01), Chan
patent: 6682861 (2004-01-01), Chan

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