Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-01-04
2011-01-04
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C438S014000
Reexamination Certificate
active
07863918
ABSTRACT:
A device and method for self-testing an integrated circuit layer for a three-dimensional integrated circuit includes integrally forming a disposable self-test circuit on a common substrate with a first circuit to be tested. The first circuit forms a layer in a three-dimensional integrated circuit structure. The first circuit is tested using circuitry of the self-test circuit. The self-test circuit is removed by detaching the self-test circuit from the first circuit.
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Jenkins Keith A.
Kim Seongwon
Dougherty, Esq. Anne V.
International Business Machines - Corporation
Nguyen Trung Q
Tang Minh N
Tutunjian & Bitetto, P.C.
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