Image analysis – Applications – Manufacturing or product inspection
Patent
1997-06-24
1999-10-12
Boudreau, Leo H.
Image analysis
Applications
Manufacturing or product inspection
382149, 345904, 348 92, G06K 900
Patent
active
059664584
ABSTRACT:
A display screen inspection method according to the present invention takes a display screen of a display device as an inspection subject and makes decisions on defects of the display screen. The method includes performing a separation between display operating portions and display non-operating portions of the inspection subject present in a gray image from image data of individual pixels of the gray image obtained by picking up an image of the inspection subject, selectively extracting image data of only proper display operating portions and compressing the image data to be inspected for defects, and inspecting the selectively extracted image data for any defects.
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patent: 5717780 (1998-02-01), Mitsumune et al.
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Ishii Shoichi
Ueda Hideshi
Yukawa Noriaki
Boudreau Leo H.
Matsushita Electric - Industrial Co., Ltd.
Mehta Bhavesh
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