Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-04-12
2005-04-12
Zarneke, David (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S754090
Reexamination Certificate
active
06879180
ABSTRACT:
A rotary base having first and second surfaces on which display panels are to be placed, and a rotation shaft. The first and second surfaces can be switched between a front position (facing position) and a top position facing upward. A fixture base supports the rotary base to be rotatable about the rotation shaft. A Z-axis drive mechanism moves the fixture base forward to a predetermined position and backward to be retreated from the predetermined position. When the fixture base is moved to the predetermined position by the Z-axis drive mechanism, a probe unit is connected to the display panel.
REFERENCES:
patent: 5691764 (1997-11-01), Takekoshi et al.
patent: 5825500 (1998-10-01), Iino et al.
patent: 8-189946 (1995-01-01), None
patent: 08-189946 (1996-07-01), None
patent: 11-183864 (1997-12-01), None
patent: 11-014957 (1999-01-01), None
patent: 2000-147044 (2000-05-01), None
patent: 2000-321545 (2000-11-01), None
Iwata Toshiaki
Sakamoto Hitoshi
A. Marquez, Esq. Juan Carlos
Chan Emily Y
Fisher Esq. Stanley P.
Reed Smith LLP
Tokyo Electronics Industry Co., Ltd.
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