Liquid crystal cells – elements and systems – Nominal manufacturing methods or post manufacturing... – Defect correction or compensation
Reexamination Certificate
2011-02-01
2011-02-01
Rude, Timothy (Department: 2871)
Liquid crystal cells, elements and systems
Nominal manufacturing methods or post manufacturing...
Defect correction or compensation
Reexamination Certificate
active
07880856
ABSTRACT:
A pixel unit including a pixel electrode, a scan electrode, a common voltage electrode, a data electrode and at least one redundancy electrode is provided. During the fabricating process of the pixel unit, if a particle is simultaneously located between any two of the pixel electrode, the scan electrode and the common voltage electrode, it would cause a short circuit between the two electrodes. The pixel unit can generate a cross-shaped defect signal at the location where a short circuit happens when the pixel unit undergoes an array test or a cell test. The user can thereby quickly locate the defect and repair it.
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patent: 6873388 (2005-03-01), Tsukao et al.
patent: 7511310 (2009-03-01), Arai et al.
patent: 2006/0125510 (2006-06-01), Brunner et al.
patent: 2009/0225067 (2009-09-01), Yoda et al.
Chen Chin-Fon
Hsieh Meng-ying
Lu Chi-Hung
Peng Chung-Hung
Au Optronics Corporation
Jiang Chyun IP Office
Rude Timothy
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