Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Including integrally formed optical element
Reexamination Certificate
2007-01-16
2007-01-16
Tran, Long (Department: 2818)
Semiconductor device manufacturing: process
Making device or circuit emissive of nonelectrical signal
Including integrally formed optical element
C257SE21596, C349S054000, C349S192000, C324S701000
Reexamination Certificate
active
10824907
ABSTRACT:
An array test is performed during the process of panel formation, such as at a stage where a driving TFT which supplies a drive current for an organic EL element is completed and an anode of the organic EL element has been formed on the TFT. Then, with regard to a defective pixel, a line connecting the driving TFT and the anode is disconnected using a laser. After the line has been thus disconnected, a planarization insulating film is formed, and this film fills the holes caused by the laser irradiation. It is thus possible to suppress deterioration of pixels and also effectively darken a defective pixel using laser.
REFERENCES:
patent: 6873174 (2005-03-01), Matsunaga et al.
patent: 2002/0154079 (2002-10-01), Shiota et al.
Cantor & Colburn LLP
Sanyo Electric Co,. Ltd.
Tran Long
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