Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-08-16
1997-12-02
Karlsen, Ernest F.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324501, G01R 3102, G01R 3100
Patent
active
056940530
ABSTRACT:
A testing device tests devices having a matrix of signal generators or sensors. The testing device uses a test plate having a plurality of signal generators or sensors arranged in a pattern matching the matrix of sensors or signal generators on the device to be tested. Individual signal generators or sensors on the test plate are electromagnetically coupled to a corresponding signal generator or sensor on the device to be tested. The signal generators or sensors on the test plate produce a pattern of signals or sense signals output by the device to be tested. Comparison of the signals output or sensed by the testing device to the signals output or sensed by the device to be tested indicates if the device to be tested is operating properly. A particular testing device is provided for testing the matrix of display electrodes in an active matrix liquid crystal display before liquid crystal processing of the display is completed. Charge-sensing electrodes of the testing device sense charges on corresponding display electrodes which are driven in accordance with a test image. A sensed image is generated based on the charges sensed by the charge-sensing electrodes. A comparison of the test image to the sensed image indicates if the matrix of display electrodes is working properly.
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Photon Dynamics, Inc. In Process Tester User's Manual 1.2, Apr. 1993, pp. 1-1 thru 1-12.
Karlsen Ernest F.
Xerox Corporation
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