Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-01-31
2009-08-04
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C345S087000
Reexamination Certificate
active
07570072
ABSTRACT:
To provide a display device having a test circuit with high accuracy for testing in the step after a counter substrate is attached and before shipping, and to provide a display device having a correction circuit inside the display device, for the case where a defect occurs. A pixel circuit operated by a gate line and a source line, a first wiring formed at the same time as the gate line, a second wiring formed at the same time as the source line, and a test circuit of detecting a defect of the pixel circuit by using potentials of the first wiring and the second wiring are provided over a substrate.
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Hata Yuki
Iwabuchi Tomoyuki
Kimura Akihiro
Nagatsuka Shuhei
Fish & Richardson P.C.
Isla Rodas Richard
Nguyen Ha Tran T
Semiconductor Energy Laboratory Co,. Ltd.
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