Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-05-02
2006-05-02
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C345S087000
Reexamination Certificate
active
07038484
ABSTRACT:
A display device includes a first inspection wiring line that is connected to first wiring lines of a first wiring line group and to third wiring lines of a second wiring line group, and a second inspection wiring line that is connected to second wiring lines of the first wiring line group, which neighbor the first wiring lines, and to fourth wiring lines of the second wiring line group, which neighbor the third wiring lines.
REFERENCES:
patent: 6762735 (2004-07-01), Koyama
patent: 6-160898 (1994-09-01), None
patent: 2001-13892 (2001-01-01), None
Harada Kazuyuki
Kimura Yohei
Nakayama Koji
Kobert Russell M.
Nguyen Vinh
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Toshiba Matsushita Display Technology Co., Ltd.
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