Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2011-03-01
2011-03-01
Lee, Eugene (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S057000, C257SE33001
Reexamination Certificate
active
07897971
ABSTRACT:
To provide a display device including a protection circuit having a thin film transistor which has small size and high withstand voltage. In the protection circuit of the display device, a thin film transistor is used in which an amorphous semiconductor layer, a microcrystalline semiconductor layer, a gate insulating layer which is in contact with the microcrystalline semiconductor layer, and a gate electrode layer overlap with each other. Since current drive capability of the microcrystalline semiconductor layer is high, the size of the transistor can be made small. In addition, the amorphous semiconductor layer is included, so that the withstand voltage can be improved. Here, the display device is a liquid crystal display device or a light-emitting device.
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Ikeda Takayuki
Kurokawa Yoshiyuki
Lee Eugene
Robinson Eric J.
Robinson Intellectual Property Law Office P.C.
Semiconductor Energy Laboratory Co,. Ltd.
Wright Tucker
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