Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2011-01-25
2011-01-25
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C349S151000
Reexamination Certificate
active
07876122
ABSTRACT:
An array substrate is provided with thereon a display area in which plural pixels are arranged in a matrix shape. Output-side mounting terminals for a source driving circuit chip, which is COG-mounted on a frame area on the outside of the display area, have a plural-row zigzag arrangement. Inspection terminals individually provided in correspondence to the output-side mounting terminals have a zigzag arrangement opposite to the zigzag arrangement of the output-side mounting terminals in a terminal-row direction. Additionally, the output-side mounting terminals and the inspection terminals are disposed below the source driving circuit chip.
REFERENCES:
patent: 7323720 (2008-01-01), Kubota et al.
patent: 7518690 (2009-04-01), Komaju
patent: 2005/0286005 (2005-12-01), Watanabe et al.
patent: 2006/0175713 (2006-08-01), Aramatsu
patent: 2006-10898 (2006-01-01), None
patent: 2006-72032 (2006-03-01), None
patent: 2006-215302 (2006-08-01), None
Masutani Yuichi
Noumi Shigeaki
Mitsubishi Electric Corporation
Nguyen Ha Tran T
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Vazquez Arleen M
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