Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-12-19
2008-10-21
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
07439758
ABSTRACT:
Provided are a detection element Em used for controlling a value of a drive voltage for each light emitting element constituting a display pixel, and a leakage detection circuit4which separates the detection element Em from a current source I1when this detection element Em is in a leakage state. Further provided are a pseudo leakage setup means5with which a potential of an anode terminal in the above-mentioned detection element can be set as a pseudo leakage potential which is a potential when the detection element is in the leakage state, and an operation detection means6to verify that the leakage detection circuit4operates normally when operating the above-mentioned pseudo leakage setup means5.
REFERENCES:
patent: 2005-107003 (2005-04-01), None
Patel Paresh
Tohoku Pioneer Corporation
Westerman, Hattori, Daniels & Adrian , LLP.
LandOfFree
Display apparatus and method of inspecting the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Display apparatus and method of inspecting the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Display apparatus and method of inspecting the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4014026