Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2006-12-05
2006-12-05
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C345S904000
Reexamination Certificate
active
07145358
ABSTRACT:
The test circuit of a display apparatus according to the invention detect short-circuiting in each of the data lines Dn by inputting the electric potential Vd of the data line Dn connected to the corresponding one of high resistance first short-circuiting detecting resistors Trln connecting a predetermined electric potential and the data line Dn to the corresponding one of first detector logic circuits and binarizing and outputting the input electric potential Vd of the data line Dn by referring to a predetermined threshold value and also detect short-circuiting in each of the gate lines Gm by inputting the electric potential of the gate line Gm connected to the corresponding one of high resistance second short-circuiting detecting resistors connecting a predetermined electric potential and the gate line Gm to the corresponding one of second detector logic circuits and binarizing and outputting the input electric potential of the gate line by referring to a predetermined threshold value. The defects (short-circuits) produced in the process of manufacturing the display apparatus can be inspected by a simple technique.
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Patel Paresh
Sonnenschein Nath & Rosenthal LLP
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