Optics: measuring and testing – Material strain analysis
Patent
1984-04-19
1986-02-25
Punter, William H.
Optics: measuring and testing
Material strain analysis
250239, 356373, G01B 1116, H01J 502
Patent
active
045726078
ABSTRACT:
A transducer including a phototransistor arranged to receive light emitted from a light emitting diode and a movable shield between the transistor and diode. The shield is moved relative to the transistor and diode, within a predetermined range, and there is a linear relationship between the displacement of the shield and changes in the output of the phototransistor. The shield is connected to a member whose displacement is to be measured, and displacement of the member is measured simply by measuring the voltage output of the phototransistor.
REFERENCES:
patent: 2877284 (1959-03-01), Schultz
patent: 3308303 (1967-03-01), Weichselbaum et al.
Sisam, C. H. "Analytic Geometry", Henry Holt and Co., 1936, 1949, pp. 155-159, 210-215.
General Electric, "Solid State Optoelectronics", Specification Sheets for Photon Coupled Interrupter Module HBA1 and HBA2.
IDR Enterprises, Inc.
Punter William H.
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