Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1991-12-03
1993-08-03
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356374, 250237G, 33707, G01B 1100
Patent
active
052334074
ABSTRACT:
The invention provides a thin-profile displacement signal output device. The device comprises a first member having a periodic pattern consisting of alternating high-transmittance and low-transmittance regions, a second member having a periodic pattern consisting of alternating high-reflectance regions, a light emitting source for emitting a detection light beam and a light-receiver for receiving the reflected light, the first member and second member facing each other and spaced apart by a distance which is smaller than the pitch of the periodic pattern, the light-emitting source and light receiver means being both disposed on one side of said first member which is opposite to the side on which said second member is disposed, and the first and second member being displaceable relative to each other.
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Evans F. L.
Omron Corporation
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