Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-06-01
1996-01-23
Limanek, Robert P.
Optics: measuring and testing
By polarized light examination
With light attenuation
356387, 356385, 345163, 341 13, G01B 1114, G01B 1102
Patent
active
054869250
ABSTRACT:
A light receiving portion which receives light from a light emitting portion through slits formed in a rotating disc is provided with, first, second and third photodiodes. With an output of the second photodiode as a reference value, an output of the first photodiode is compared with the reference value and pulsed by a first comparator, and an output of the third photodiode is compared with the reference value and pulsed by a second comparator. With such a light receiving apparatus, since the output (reference value) of the second photodiode similarly decreases when the outputs of the first and third photodiodes decrease due to a decrease of the light quantity of the light emitting portion, the deviation of the phase difference never occurs between outputs of the first and second comparators.
REFERENCES:
patent: 4912322 (1990-03-01), Ichikawa
patent: 4971445 (1990-11-01), Sato et al.
patent: 5008528 (1991-04-01), Duchon
patent: 5194919 (1993-03-01), Katayama
patent: 5252968 (1993-10-01), Donovan
patent: 5276323 (1994-01-01), Nakaho
Ogawa Tadayoshi
Sano Masashi
Limanek Robert P.
Rohm & Co., Ltd.
Williams Alexander Oscar
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