Measuring and testing – Probe or probe mounting
Patent
1990-04-30
1992-07-21
Raevis, Robert
Measuring and testing
Probe or probe mounting
G01D 2100
Patent
active
051312840
ABSTRACT:
A probe for measuring the displacement between the outer supporting wall of a cryostat and the inner magnet coil form employs magnetically balanced strain gauges attached to a beam with one end fixed to the cryostat wall and the other end held by the magnet coil form. The magnetically balanced strain gauges comprise two superimposed strain gauges with countervailing current flow. In one embodiment, two sets of gauges are attached in conventional bridge arrangement to provide temperature compensation.
REFERENCES:
patent: 2414161 (1947-01-01), Moore
patent: 3064221 (1962-11-01), King
patent: 3240055 (1966-03-01), Eddens
patent: 4721934 (1988-01-01), Stacy
Catalogue page, "Strain Gages for Use in Intense Magnetic Field Environments" p. 73.
Measurement Systems, Application and Design, Ernest O. Doebelin, pp. 231-233.
Mansell Scott T.
Radziun Michael J.
General Electric Company
Raevis Robert
LandOfFree
Displacement probe for cryogenic magnet does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Displacement probe for cryogenic magnet, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Displacement probe for cryogenic magnet will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-836257