Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2005-04-12
2005-04-12
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C250S231130, C250S23700G
Reexamination Certificate
active
06879405
ABSTRACT:
A displacement pickup is provided which comprising a scale (12) having defined thereon a first area (12a) where positional information is recorded with a predetermined pitch and a second area (12b) where positional information is recorded with a pitch different from that in the first area (12a), a first reader (10) which reads the positional information recorded in the first area (12a), a first phase detector (14) which detects a first phase on the basis of the positional information read by the first reader (10), a second reader (11) which reads the positional information recorded in the second area (12b), a second phase detector (15) which detects a second phase on the basis of the positional information read by the second reader (11), a phase comparator (16) which makes a comparison between the first and second phases, and an origin signal selector (18) which produce a plurality of signals according to the result of comparison and selects an arbitrary one of the plurality of signals on the basis of the positional information read by the first reader (10).
REFERENCES:
patent: 4676645 (1987-06-01), Taniguchi et al.
patent: 5017777 (1991-05-01), Ishizuka et al.
patent: 5717488 (1998-02-01), Watanabe
patent: 50-23618 (1975-08-01), None
patent: 8-122097 (1996-05-01), None
patent: 8-304112 (1996-11-01), None
Kanbara Eiko
Tamiya Hideaki
Taniguchi Kayoko
Haverstock & Owens LLP
Pham Hoa Q.
Sony Precision Technology Inc.
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