Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1999-04-06
2000-10-03
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356345, 356346, G01B 902
Patent
active
061280836
ABSTRACT:
The displacement measuring apparatus of a laser interference technology includes a probe 3 which delivers at a photodetector 17 an RF signal of which a modulated component proportional to a displacement of an object 2 under measurement. The apparatus has also a phase-demodulation circuit 9 in which an interference signal produced by shifting the frequency of the RF signal to an intermediate frequency is phase-demodulated on the basis of the carrier signal for supply to a light modulator 16. Thus the apparatus can detect a displacement of the object with a high resolution.
Kim Robert H.
Maioli Jay H.
Sony Precision Technology Inc.
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