Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2011-04-12
2011-04-12
Connolly, Patrick J (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S521000, C250S23700G
Reexamination Certificate
active
07924433
ABSTRACT:
A measurement displacement system and method are described. The measurement displacement system comprises a sensor head configured to transmit input optical beams and to receive measurement beams. The system comprises a transmission grating configured to diffract the input optical beams into sub-beams comprising more than one diffraction order. The transmission grating is adapted move in a direction. The measurement displacement system comprises a reflective element configured to diffract the sub-beams from the transmission grating and to return the sub-beams to the transmission grating. The reflective element is substantially stationary relative to the sensor head and the transmission grating selectively recombines the sub-beams to form the measurement beams and returns the measurement beams to the sensor head.
REFERENCES:
patent: 4772119 (1988-09-01), Bouwhuis et al.
patent: 4815850 (1989-03-01), Kanayama et al.
patent: 4979826 (1990-12-01), Ishizuka et al.
patent: 5000572 (1991-03-01), Nose et al.
patent: 5333048 (1994-07-01), Michel et al.
patent: 5569913 (1996-10-01), Ishizuka et al.
patent: 5661296 (1997-08-01), Ishizuka et al.
patent: 5696373 (1997-12-01), Fukui et al.
patent: 5696374 (1997-12-01), Fukui et al.
patent: 6005667 (1999-12-01), Takamiya et al.
patent: 6429940 (2002-08-01), Willhelm
patent: 6771377 (2004-08-01), Jones et al.
patent: 6891150 (2005-05-01), Takayama et al.
patent: 2002/0000515 (2002-01-01), Takayama et al.
patent: 2002/0085210 (2002-07-01), Takayama et al.
patent: 2004/0090636 (2004-05-01), Holzapfel et al.
patent: 2005/0162661 (2005-07-01), Yamamoto
patent: 2007/0058173 (2007-03-01), Holzapfel
patent: 2008/0304079 (2008-12-01), Schluchter et al.
Agilent Technologie,s Inc.
Connolly Patrick J
LandOfFree
Displacement measurement system and method of use does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Displacement measurement system and method of use, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Displacement measurement system and method of use will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2622224