Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate
2006-08-01
2006-08-01
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
C382S294000
Reexamination Certificate
active
07085673
ABSTRACT:
A displacement estimation system including a data acquisition system and a processing system is provided. The data acquisition system is configured to capture a first frame from a first substrate including a first pattern and a second substrate including a second pattern at a first time and capture a second frame from a third substrate including a third pattern and a fourth substrate including a fourth pattern at a second time subsequent to the first time. The first pattern and the third pattern are substantially identical, and the second pattern and the fourth pattern are substantially identical. The processing system is configured to calculate a first displacement between the first pattern and the third pattern using the first frame and the second frame and calculate a second displacement between the second pattern and the fourth pattern using the first frame and the second frame.
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Gao Jun
Picciotto Carl E.
Wu Wei
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