Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-07-13
1996-06-04
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356375, 385 14, G01B 1114
Patent
active
055238440
ABSTRACT:
An apparatus for detecting a displacement of an object comprises a light source element for emitting a detection light beam, a reflection member for reflecting the detection light beam from the light source element, the detection light beam being irradiated to the object by the reflection by the reflection member, a photo-sensing element for sensing the detection light beam reflected from the object by a photo-sensing plane thereof to detect an incident position of the detection light beam on the photo-sensing plane, displacement information of the object being determined in accordance with the detection by the photo-sensing element, and a substrate having the light source element, the reflection member and the photo-sensing element arranged thereon.
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Hasegawa Masanobu
Mishima Seiji
Ohguri Noriaki
Sekine Masayoshi
Yoshii Minoru
Canon Kabushiki Kaisha
Pham Hoa Q.
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