Disk inspection apparatus

Details Disk inspection apparatus Disk inspection apparatus

2011-08-30

2011-08-30

Young, Wayne (Department: 2627)

Dynamic information storage or retrieval

Condition indicating, monitoring, or testing

Including radiation storage or retrieval

C369S044320

Reexamination Certificate

active

08009537

ABSTRACT:
A disk inspection apparatus for discriminating disks. The disk inspection apparatus has an ECC control section and a comparison section. The ECC control section measures the number of error corrections PIE and the number of error correction failures PIF in a predetermined section of the disk. The comparison section discriminates the disk as a disk with a deterioration in jitter characteristic when the minimum or the average of the PIE exceeds a first threshold value; discriminates the disk as a normal disk when the maximum of the PIF is equal to or smaller than a second threshold and the minimum or the average of the PIE is equal to or smaller than the first threshold value; and discriminates the disk as a scratched disk when the minimum or the average of the PIE is equal to or smaller than the first threshold value and the maximum of the PIF exceeds the second threshold value.

REFERENCES:
patent: 2010/0329093 (2010-12-01), Kubo et al.
patent: 10134527 (1998-05-01), None
patent: 3093865 (2003-02-01), None
patent: 2004330375 (2004-11-01), None

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