Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1996-09-09
1998-03-24
Font, Frank G.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356328, G01J 328
Patent
active
057318743
ABSTRACT:
A diffraction grating, diffraction structure or Fresnel zone device is formed on a first substrate for diffracting light components of different wavelengths. An array of detectors is formed on a second substrate for detecting different wavelength components diffracted where the second substrate is spaced apart from the grating, structure or device to form a spectrometer. Spectrometers sensitive to the particular spectral lines may be used for detecting the presence of substances. The spectral resolution at such spectral lines may be increased relative to other regions to enhance the sensitivity of detection. This is done by inverse Fourier transform of the desired discrete spectrum to obtain a desired transmission function and by half-toning the aperture function.
REFERENCES:
patent: 4822998 (1989-04-01), Yokota et al.
patent: 4878735 (1989-11-01), Vilums
patent: 5020910 (1991-06-01), Dunn et al.
patent: 5037201 (1991-08-01), Smith, III et al.
patent: 5050990 (1991-09-01), Smith, III et al.
patent: 5050992 (1991-09-01), Drummond et al.
patent: 5119183 (1992-06-01), Weisfield et al.
patent: 5159404 (1992-10-01), Bittner
patent: 5161040 (1992-11-01), Yokoyama et al.
patent: 5178636 (1993-01-01), Silberman
patent: 5210400 (1993-05-01), Usami
patent: 5349176 (1994-09-01), Czichy
Rabiner and Gold, "Theory of Discrete-Time Linear Systems," Theory and Application of Digital Signal Processing, 1975, Prentice-Hall, Inc., pp. 9-12, 26-28. (no month available).
Rabiner and Gold, "Finite Word Length Effects in Digital Filters," Theory and Application of Digital Signal Processing, 1975, Prentice-Hall, Inc., pp. 296-297. (no month available).
Hecht and Zajac, Optics, 1979, Addison-Wesley Publishing Company, pp. 347, 411-414. (no month available).
Goldman, White and Anheier, "Miniaturized Spectrometer Employing Planar Waveguides and Grating Couplers for Chemical Analysis," Applied Optics, Nov. 1990, vol. 29, No. 31, pp. 4583-4589.
Soole, Schere, LeBlanc, Andreadakis, Bhat and Koza, "Spectrometer on a Chip: InP-based Integrated Grating Spectrograph for Wavelength Multiplexed Optical Processing," Optical Technology for Signal Processing Systems, Mar. 1991, SPIE vol. 1474, pp. 268-274.
Holm-Kennedy, Tsang, Sze, Jiang and Yang, "A Novel Monolithic, Chip-integrated, Color Spectrometer: The Distributed Wavelength Filter Component," Current Developments in Optical Design and Optical Engineering, Apr. 1991, SPIE vol. 1527, pp. 322-331.
Stephen, "A Comparison of Selected Digital Halftoning Techniques," Microsystems, Jun. 1991, vol. 15, No. 5, pp. 249-255.
Terasawa, Hasegawa, Fukuda and Katagiri, "Imaging Characteristics of Multi-Phase-Shifting and Halftone Phase-Shifting Masks," Journal of Applied Physics, Nov. 1991, No. 11B, pp. 2991-2997.
Kwa and Wolffenbuttel, "Integrated Grating/Detector Array Fabricated in Silicon Using Micromachining Techniques," Sensors and Actuators, 1992, A.31, pp. 259-266. (no month available).
Pati, Wang, Liang and Kailath, "Phase-Shifting Masks: Automated Design and Mask Requirements," Optical/Laser Microlithography VII, Jan. 1994, SPIE vol. 2197, pp. 314-327.
Font Frank G.
The Board of Trustees of the Leland Stanford Junior University
Vierra-Eisenberg Jason D.
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