Directional reflectometer

Details Directional reflectometer Directional reflectometer

2006-01-03

2006-01-03

Pham, Hoa Q. (Department: 2877)

Optics: measuring and testing

Of light reflection

With diffusion

C356S051000, C250S339110, C250S341800

Reexamination Certificate

active

06982794

ABSTRACT:
The present invention is a directional reflectometer that measures, for example, the optical bidirectional reflectance distribution function [BRDF] of a surface in situ on a finished article, e.g. a vehicle, to provide information on its surface reflectivity and emissivity. The light wavelength may be IR, near-IR, visible, UV, or longer wavelengths. Light, preferably focused to a small spot on the surface, is projected onto the surface at an angle adjustable in azimuth and elevation. A wide angle mirror, lens system, or both transfers light scattered from the surface onto an imaging sensor, preserving scattering angle information and thereby permitting the BRDFs for a given incidence angle and all scattering angles to be measured simultaneously. A computer reads the sensor outputs and analyzes the quality of the surface in a factory or field environment.

REFERENCES:
patent: 4030837 (1977-06-01), Kojima et al.
patent: 4277177 (1981-07-01), Larsen et al.
patent: 4360275 (1982-11-01), Louderback
patent: 4565450 (1986-01-01), Wirz et al.
patent: 4601576 (1986-07-01), Galbraith
patent: 4661706 (1987-04-01), Messerschmidt et al.
patent: 4761676 (1988-08-01), Wiles et al.
patent: 4815858 (1989-03-01), Snail
patent: 4902131 (1990-02-01), Yamazaki et al.
patent: 4961646 (1990-10-01), Schrammli et al.
patent: RE33424 (1990-11-01), Noguchi et al.
patent: 4988205 (1991-01-01), Snail
patent: 5078496 (1992-01-01), Parket et al.
patent: 5153445 (1992-10-01), Stapleton
patent: 5229835 (1993-07-01), Reinsch
patent: 5293211 (1994-03-01), Bernard et al.
patent: 5337144 (1994-08-01), Strul et al.
patent: 5376793 (1994-12-01), Lesniak
patent: 5416594 (1995-05-01), Gross et al.
patent: 5465145 (1995-11-01), Nakashige et al.
patent: 5605838 (1997-02-01), Backhaus et al.
patent: 5659397 (1997-08-01), Miller et al.
“New Device Measures Degradation of Sensor Windows Quickly, Accurately,” AvWeek & Space Tech., May 13, 1991.
“Light Scatter: A New Light on Quality,” TMA Technical Bulletin, vol. 1, No. 2, Sep. 15, 1991.
Kaplan, “How Clean is Clean?” Photonics Spectra, Jun., 1993.
“TMA μScan Surface Roughness and Scatter Measurement Instrumentation” [μScan Scatterometer], TMA Technologies, Inc., Jan. 30, 1992, [offered for sale to Boeing, Jun. 1, 1993].
“Laboratory Portable SpectroReflectometer Model LPSR-200-IR” AZ Technology, Inc. (no date).
“TEMP 2000 Portable Emissometer,” AZ Technology, Inc. (no date).

Affiliated with

Also associated with

Rating

Directional reflectometer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Directional reflectometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Directional reflectometer will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3542330