Directed self-heating for reduction of system test time

Details Directed self-heating for reduction of system test time Directed self-heating for reduction of system test time

1998-08-26

2000-12-19

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3102

Patent

active

061631612

ABSTRACT:
An integrated circuit provides self-heating in order to assist an externally applied thermal control unit raise the temperature of the integrated circuit to a specified range of temperatures at which functional testing is conducted. In a particular embodiment of the present invention, a packaged integrated circuit that is thermally coupled to a heat dissipating device, including but not limited to a heat sink, is operated in a high power manner prior to functional testing, so as to quickly raise internal junction temperatures to a specified test range before functional testing begins.

REFERENCES:
patent: 3976940 (1976-08-01), Chau et al.
patent: 5760595 (1998-06-01), Edwards et al.
patent: 5977785 (1999-11-01), Burward-Hoy

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