Direct-heated flow measuring apparatus having uniform characteri

Measuring and testing – Volume or rate of flow – Thermal type

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G01F 168

Patent

active

047561904

ABSTRACT:
In a direct-heated flow measuring apparatus including a film resistor having a substrate and a resistance layer thereon, the substrate is supported by a supporting member in a passage. Provided between the substrate and the supporting member is an adiabatic member for enhancing the adiabatic effect of the resistance layer. The substrate is adhered by adhesives having an excellent thermal conductivity coefficient to the adiabatic member, and the supporting member is also adhered by adhesives having an excellent thermal conductivity coefficient to the adiabatic member.

REFERENCES:
patent: 3747577 (1973-07-01), Mauch et al.
patent: 3975951 (1976-08-01), Kohama et al.
patent: 4279146 (1981-07-01), Wessel et al.
patent: 4513615 (1985-04-01), Sato et al.
patent: 4559814 (1985-12-01), Sato et al.
patent: 4627279 (1986-12-01), Ohta et al.

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