Direct determination of quantum efficiency of semiconducting fil

Details Direct determination of quantum efficiency of semiconducting fil Direct determination of quantum efficiency of semiconducting fil

1983-03-11

1986-01-14

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158D, G01R 3126

Patent

active

045648085

ABSTRACT:
Photovoltaic quantum efficiency of semiconductor samples is determined directly, without requiring that a built-in photovoltage be generated by the sample. Electrodes are attached to the sample so as to form at least one Schottky barrier therewith. When illuminated, the generated photocurrent carriers are collected by an external bias voltage impressed across the electrodes. The generated photocurrent is measured, and photovoltaic quantum efficiency is calculated therefrom.

REFERENCES:
patent: 4051437 (1977-09-01), Lile et al.
patent: 4333051 (1982-06-01), Goodman
patent: 4456879 (1984-06-01), Kleinknecht
patent: 4464627 (1984-08-01), Munakata et al.

Affiliated with

Also associated with

Rating

Direct determination of quantum efficiency of semiconducting fil does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Direct determination of quantum efficiency of semiconducting fil, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Direct determination of quantum efficiency of semiconducting fil will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-432235