Chemistry: molecular biology and microbiology – Measuring or testing process involving enzymes or... – Involving viable micro-organism
Reexamination Certificate
2004-09-08
2010-11-16
Weber, Jon P. (Department: 1657)
Chemistry: molecular biology and microbiology
Measuring or testing process involving enzymes or...
Involving viable micro-organism
C313S564000
Reexamination Certificate
active
07833745
ABSTRACT:
A rapid and efficient method for novel biological substance screening by surface analysis has been developed using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). This method relies on the surface screening of an array of micro-organisms grown on porous membranes, which had previously been in contact with a solid growth medium. ToF-SIMS analysis differentiates among organisms producing different substances, either directly as molecular product, or indirectly through the use of multivariate statistical data reduction techniques. This method has many advantages over traditional microbial screening methods, which require sample preparation and time for assay development.
REFERENCES:
patent: 5914245 (1999-06-01), Bylina et al.
patent: 6472163 (2002-10-01), Coleman et al.
patent: 2003/0116707 (2003-06-01), Brown et al.
patent: 2004/0132080 (2004-07-01), Kawaguchi et al.
patent: WO 00/48004 (2000-08-01), None
Verran et al. J of Food Protection 2001;64(9):1377-1387.
Cheran et al. Analyst 2003;128:126-129.
Colliver et al. “Atomic and molecular imaging at the single-cell level with TOF-SIMS”, Anal. Chem. 1997, 69:2225-2231.
Ben Cliff et al., Probing cell chemistry with time-of-light secondary ion mass spectrometry: development and exploitation of instrumentation for studies of frozen-hydrated biological material, Rapid Communications in Mass Spectrometry, vol. 17:2163-2167, 2003.
Roger Michel et al., Selective Molecular Assembly Patterning: A New Approach to Micro- and Nanochemical Patterning of Surfaces for Biological Applications, Langmuir, vol. 18:3281-3287, 2002.
Thomas L. Colliver et al., Atomic and Molecular Imaging at the Single-Cell Level with TOF-SIMS, Anal. Chem., vol. 69:2225-2231, 1997.
Peter Sjovall et al., Imaging of Membrane Lipids in Single Cells by Imprint-Imaging Time-of-Flight Secondary Ion Mass Spectrometry, Anal. Chem., vol. 75:3429-3434, 2003.
Michaeleen L. Pacholski et al., Static Time-of-flight Secondary Ion Mass Spectrometry Imaging of Freeze-fractured, Frozen-hydrated Biological Membranes, Rapid Communications in Mass Spectrometry, vol. 12:1232-1235, 1998.
Robert M. Braun et al., Spatially Resolved Detection of Attomole Quantities of Organic Molecules Localized in Picoliter VialsUsing Time-of-Flight Secondary Ion Mass Spectrometry, Anal. Chem., vol. 71:3318-3324, 1999.
Donald M. Cannon, Jr. et al., Molecule Specific Imaging of Freeze-Fractured. Frozen-Hydrated Model Membrane Systems Using Mass Spectrometry, J. Am. Chem. Soc., vol. 122:603-610, 2000.
Werner Edgar Glabgen et al., Metabolism of the Herbicide Isoproturon in Wheat and Soybean Cell Suspension Cultures, Pesticide Biochemistry and Physiology, vol. 63:97-113, 1999.
Bonnie J. Tyler et al., Multivariate Statistical Approaches for Interpreting TOF-SIMS Spectra of Bacterial and Fungal Cell Walls, Proceedings of the 12thInternational Conference on Secondary Ion Mass Spectrometry, Brussels, Belgium, 1999.
H.-U. JABS, Characterization of an Apolipoprotein C-III Mutant by High-Performance Liquid Chromatography and Time-of-Flight Secondary Ion Mass Spectrometry, J. of Chromatography, vol. 414:323-333, 1987.
Lloyd Kathryn G.
O'Keefe Daniel P.
E. I. du Pont de Nemours and Company
Shen Bin
Weber Jon P.
LandOfFree
Direct detection method for products of cellular metabolism... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Direct detection method for products of cellular metabolism..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Direct detection method for products of cellular metabolism... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4189180