Optics: measuring and testing – By particle light scattering
Reexamination Certificate
2006-04-18
2006-04-18
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
By particle light scattering
Reexamination Certificate
active
07030980
ABSTRACT:
A fluid particle counter comprising an intracavity diode pumped solid state laser having a solid state lasing material having a non-reflective coating and a concave mirror having a reflective coating, with the coatings isolated from the sample flow by Brewster windows. The laser beam is apertured by an aperture assembly including an inner aperture closest to the inlet nozzle assembly and an outer aperture farther from the inlet nozzle assembly, with the outer aperture significantly farther from the inner aperture than the inner aperture is from the inlet nozzle assembly.
REFERENCES:
patent: 4728190 (1988-03-01), Knollenberg
patent: 4798465 (1989-01-01), Knollenberg
patent: 4893928 (1990-01-01), Knollenberg
patent: 5726753 (1998-03-01), Sandberg
patent: 5751422 (1998-05-01), Mitchell
patent: 5889589 (1999-03-01), Sandberg
patent: 5920388 (1999-07-01), Sandberg et al.
patent: 6181419 (2001-01-01), Snelling et al.
patent: 6768545 (2004-07-01), Matsuda et al.
patent: 2004/0042008 (2004-03-01), Wagner et al.
patent: 2004/0080747 (2004-04-01), Cerni et al.
Cerni Todd A.
Sehler Dwight A.
Nguyen Tu T.
Particle Measuring Systems, Inc.
Patton & Boggs LLP
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