Diode faults detecting apparatus

Details Diode faults detecting apparatus Diode faults detecting apparatus

1979-11-26

1982-08-24

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

340645, G01R 3122

Patent

active

043463479

ABSTRACT:
First and second diodes are formed on the same semiconductor substrate. Both the diodes are forward biased by a direct current power supply. An attenuator is connected to a positive terminal of the first diode to produce an output lower in level than a voltage on the positive terminal of the first diode. A comparator receives the output of the attenuator as a first input and a voltage on a positive terminal of said second diode as a second input. When the first input is smaller than the second input, the comparator produces an output "0." When the first diode is open-circuited and the first input becomes greater than the second input, the comparator produces an output "1" and detects the fault of the first diode.

REFERENCES:
Hubner, et al.; "Uniform Turn-On . . . "; Ire Trans. on Electron Devices; Nov. 1961; pp. 461-464.
White, J. F.; "Semiconductor Control"; 1977; Artech House Inc., Dedham, Mass.; pp. 136, 137.

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