Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-08-08
2006-08-08
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S188000
Reexamination Certificate
active
07089126
ABSTRACT:
A method for discovering a power level in a diode discovery circuit includes transmiting a pulse signal from a diode discovery device on a first line, receiving the pulse signal in the diode discovery device on a second line, measuring a time to charge a capacitor in response to applying power to determine the power level, and applying power in response to comparing the transmitted pulse signal to the received pulse signal and to measuring the time.
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patent: 2003/0014658 (2003-01-01), Walker et al.
patent: 2004/0170428 (2004-09-01), Barker et al.
Fish & Richardson P.C.
Hoff Marc S.
Intel Corporation
Suglo Janet L
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