Active solid-state devices (e.g. – transistors – solid-state diode – With specified impurity concentration gradient
Reexamination Certificate
2008-01-03
2010-11-23
Toledo, Fernando L (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
With specified impurity concentration gradient
C257S487000, C257S492000, C257SE29327, C257SE21327, C257S558000
Reexamination Certificate
active
07838969
ABSTRACT:
A diode is disclosed. One embodiment provides a semiconductor body having a front and a back, opposite the front in a vertical direction of the semiconductor body. The semiconductor body contains, successively in the vertical direction from the back to the front, a heavily n-doped zone, a weakly n-doped zone, a weakly p-doped zone and a heavily p-doped zone. In the vertical direction, the weakly p-doped zone has a thickness of at least 25% and at most 50% of the thickness of the semiconductor body.
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Barthelmess Reiner
Niedernostheide Franz-Josef
Schulze Hans-Joachim
Diallo Mamadou
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Toledo Fernando L
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