Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate
2006-01-10
2009-06-09
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
Reexamination Certificate
active
07546218
ABSTRACT:
A dimension measuring device that has improved operability when an expensive display device, such as, a bar graph is used. The device includes plural dimension measuring sections and a display section for displaying dimension measurements generated by the plural dimension measuring sections, wherein the number of dimension measurements the display section can display simultaneously is less than the number of dimension measurements generated by the plural dimension measuring sections. The device also includes a display control section, which automatically selects a dimension measurement to display on the display section in accordance with the dimension measurements generated by the plural dimension measuring sections.
REFERENCES:
patent: 5280567 (1994-01-01), Kobayashi
patent: 6497051 (2002-12-01), Poole et al.
patent: 2006/0106568 (2006-05-01), Feldman
patent: 2006/0208875 (2006-09-01), Ebihara
patent: 42 15 733 (1993-11-01), None
patent: 4215733 (1993-11-01), None
patent: 0 103 216 (1984-03-01), None
patent: 0103216 (1984-03-01), None
patent: 2 790 826 (2000-09-01), None
patent: 2790826 (2000-09-01), None
patent: 4-64011 (1992-02-01), None
patent: 7-334113 (1995-12-01), None
Partial English translation of relevant parts of DE 42 15 733 A1 col. 2, lines 49-58, Claim 1.
Partial English translation of relevant parts of EP 0 103 216 A1, p. 4, lines 3-9, p. 14, lines 18-24, Claims 1 and 2.
Partial English translation of relevant parts of FR 2 790 826 A1, p. 7, lines 22-23, p. 8, lines 24-25, p. 10, lines 27-29, p. 11, lines 29-31.
European Search Report for European application No. 06250455.0, dated Jun. 13, 2006, in the name of Tokyo Seimitsu Co., Ltd.
Patent Abstract of Japan, Publication No. 07-334113, Published on Dec. 22, 1995, in the name of Morita.
Christie Parker & Hale, LLP.
Nghiem Michael P
Tokyo Seimitsu Co. Ltd.
Tosei Engineering Corp.
LandOfFree
Dimension measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Dimension measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dimension measuring device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4079802