Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-02-27
2007-02-27
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
11207014
ABSTRACT:
A scheme, including a microcomputer, for measuring physical quantities of a passive component. A programmable sinusoidal signal generator is used for generating the test analog sinusoidal signal. An analog-to-digital conversion system has a first node coupled to the first node of a serial three terminals network, a second node coupled to a second node of a voltage follower or buffer, and a third node coupled to the microcomputer for delivering a second and a third digital sinusoidal signal to determine a physical quantity of a DUT (device under test) by the microcomputer based on the second, third digital sinusoidal signal and the resistance of the reference resistor.
REFERENCES:
patent: 4404636 (1983-09-01), Campbell et al.
patent: 6703843 (2004-03-01), Slates
patent: 2003/0206021 (2003-11-01), Laletin et al.
Nghiem Michael
The Maxham Firm
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