Digitally scanned extended electron source in vacuum

Details Digitally scanned extended electron source in vacuum Digitally scanned extended electron source in vacuum

1988-12-23

1990-06-05

Wieder, Kenneth

Electric lamp and discharge devices

Plural unit

Inter-electrode connection

313306, 313310, 313325, 313338, 324541, 328 62, H01J 102

Patent

active

049316842

ABSTRACT:
A device is provided for detecting defects in wire or cable insulation which is located in a vacuum without disconnecting the cable by synchronously detecting the current in a sense conductor with respect to the potential waveform existing or imposed on the cable under test. A sense conductor and a scanned extended electron source having a linear cathode array are both placed in close proximity to and along the cable under test. Only a small portion of the cathodes in the linear array are excited at any one time and by placing the proper signals on the excitation conductors of the electron source, the electron generation scans or propagates along the entire length of the extended electron source. The current flowing in the sense conductor due to the electrons from the electron source varies depending upon the presence of defects in the cable insulation.

REFERENCES:
patent: 3096478 (1963-07-01), Brown
patent: 3263165 (1966-07-01), Eigen
patent: 3399342 (1968-08-01), Fligel
patent: 3639831 (1972-02-01), Cushman
patent: 3983377 (1976-09-01), Vittins
patent: 3990003 (1976-11-01), Agee, Jr. et al.
patent: 3991363 (1976-11-01), Lathrop
patent: 4164703 (1979-08-01), Boggs et al.
patent: 4249124 (1981-02-01), DeMesmaeker
patent: 4313169 (1982-01-01), Takagi et al.

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