Digitally driven analog test signal generator

Details Digitally driven analog test signal generator Digitally driven analog test signal generator

1998-06-02

2000-12-19

Young, Brian

Coded data generation or conversion

Analog to or from digital conversion

Differential encoder and/or decoder

H03M 166

Patent

active

061632864

ABSTRACT:
A high performance test signal generator uses a digital to analog converter which converts an N-bit digital signal, such as provided by a computer waveform generator or by a CDROM into an M-bit upsampled digital signal. The M-bit digital signal is applied to an M-bit digital to analog converter to produce an analog output signal. The analog output signal is sampled and fed back across, the discrete time/continuous time interface to the input of the conversion circuit. The test signal generator has very low power consumption yet meets very strict noise and linearity requirements. The test signal generator can be used for testing seismic sensors such as geophones or hydrophones.

REFERENCES:
patent: 5376936 (1994-12-01), Kerth et al.
patent: 5412348 (1995-05-01), Kasha et al.
patent: 5541599 (1996-07-01), Kasha et al.
patent: 5644257 (1997-07-01), Kerth et al.

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