Coded data generation or conversion – Analog to or from digital conversion – Digital to analog conversion
Reexamination Certificate
2002-08-15
2004-01-27
Tokar, Michael (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Digital to analog conversion
C341S161000, C341S159000, C341S143000
Reexamination Certificate
active
06683551
ABSTRACT:
FIELD OF THE INVENTION
The present invention may relate to a digital-to-analog converter (DAC), and may be directed to reducing a settling time of an analog output from the DAC. The invention may be suitable for implementation in an integrated circuit.
BACKGROUND TO THE INVENTION
When an analog output from a DAC changes, the change is not instantaneous but takes a certain time for the output to stabilize. The settling time is the time for the analog output to stabilize to within a certain tolerance, or margin, for example, to within a certain percentage of the final output value.
FIG. 1
depicts schematically a conventional integrated circuit DAC
10
, and parasitic impedances at the analog output which increase the settling time undesirably. The DAC
10
includes a semiconductor die
12
including an arrangement of current sources
14
whose outputs are summed. The summed output current (i.e., I
S
) passes through a leadwire
16
, or a leadwire network, to a pin
18
of an integrated circuit package.
17
. An analog voltage is developed in a circuit
20
external to the integrated circuit DAC
10
by passing the current through a load resistor
22
. The current sources
14
are controlled simultaneously so that, when the output current changes, the current sources produce a substantial step change in I
S
.
For low current applications, the effect of a parasitic capacitance
24
limits a slew rate of the generated analog voltage. The parasitic capacitance
24
includes the output capacitance of the DAC
10
, and capacitances of the external circuit
20
. Referring to
FIG. 2
, the parasitic capacitance slows the rate at which a current (i.e., I
L
) in the load resistor
22
can change. For a step change in I
S
, the change in I
L
takes the form of an exponential change, defined by an RC time constant where R is the value of the load resistor
22
and C is the value of the parasitic capacitance
24
. For low current applications, a high value of the load resistor
24
is often used to enable a reasonable voltage to be developed despite the low current. However, a high load resistor
24
increases the RC time constant, and hence the settling time, undesirably.
For high frequency applications having rapid changes, a higher current is often used to enable the value of the load resistor
24
(and thus the RC time constant) to be reduced. However, for high current applications, a parasitic inductance
26
resulting from the leadwire
16
becomes significant. The parasitic inductance
26
, coupled with the parasitic capacitance
24
, forms a resonant circuit which creates ringing in the output current I
L
. Referring to
FIG. 3
, for a step change in I
S
, the change in I
L
takes the form of an exponentially decreasing ringing superimposed on the exponential change of FIG.
2
. The magnitude of the ringing can often be as much as several bits of the DAC resolution. The settling time is adversely affected, because the output I
L
does not stabilise until the ringing has decayed.
SUMMARY OF THE INVENTION
The invention may relate to a digital to analog converter. The digital to analog converter may comprise a plurality of controllable current sources and a control circuit. The plurality of controllable current sources may include a first and a second controllable current source. Each of the plurality of controllable current sources may be controllable between a first state and a second state. The control circuit may be coupled to the plurality of controllable current sources. The control circuit may be configured to control digital to analog conversion at sampling intervals. The control circuit may be configured to control a first state transition of the first controllable current source at a timing in the sampling interval different from a second state transition of the second controllable current source.
REFERENCES:
patent: 4393370 (1983-07-01), Hareyama
patent: 4843390 (1989-06-01), van Bavel et al.
patent: 5027120 (1991-06-01), Thurston
patent: 5162799 (1992-11-01), Tanimoto
patent: 5392040 (1995-02-01), Hayashi
patent: 5942999 (1999-08-01), Cranford et al.
patent: 6157335 (2000-12-01), Suzuki et al.
patent: 6590516 (2003-07-01), Inagaki et al.
Dedic et al, Switching Circuitry, Mar. 6, 2003, Pub. No. US 2003/0043062A1.
Tester David
Wilson Timothy
LSI Logic Corporation
Mai Lam
Maiorana PC Christopher P.
Tokar Michael
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