Coded data generation or conversion – Analog to or from digital conversion – Digital to analog conversion
Reexamination Certificate
2000-03-21
2002-02-05
JeanPierre, Peguy (Department: 2819)
Coded data generation or conversion
Analog to or from digital conversion
Digital to analog conversion
C341S148000
Reexamination Certificate
active
06344815
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a digital-to-analog converter (referred to as “D/A converter” hereinafter), which is formed on a semiconductor substrate including a plurality of N-channel type MOS transistors and P-channel type MOS transistors as well and converts an input digital data into an analog voltage signal. In the following description, the plural form of the n-channel MOS transistor and the plural form of the p-channel MOS transistor will be expressed as “NMOS′” and “PMOS′”, respectively, while the single form of them will be expressed as “NMOS” and “PMOS”, respectively.
2. Prior Art
FIG. 2
is a schematic representation indicating the configuration of a prior art D/A converter of the voltage potentiometer type.
This voltage potentiometer type D/A converter is known as one of the D/A converters which are formed on the semiconductor substrate including NMOS′ and PMOS′. As shown in
FIG. 2
, the D/A converter
10
of the voltage potentiometer type for converting the digital data of n-bit into the analog voltage includes a decoder
11
for decoding the digital data of n-bit, and a plurality of voltage dividing resistances
12
which are connected in series with each other between the power source voltage VDD and the ground GND, each of resistances
12
being provided with a plurality of taps. The number of taps required for processing the digital data of n-bit can be expressed as 2
n
(n: integer). Accordingly, the taps of
1024
is needed for processing the digital data of 10-bit, for instance. Furthermore, switches of 2
n
i.e.
13
-
1
,
13
-
2
, . . . ,
13
-(2
n
−1), and
13
-(2
n
) are connected in parallel with each other between the voltage output node Nout and each of the taps of 2
n
. These switches
13
-
1
through
13
-(2
n
) are selectively turned on in correspondence with the decoding result of the decoder
11
and then transmit the voltage generated at each voltage dividing resistance
12
to the node Nout.
It might be preferable to make up each of switches
13
-
1
through
13
-(2
n
) of a pair of PMOS and NMOS from the point of view of suppressing the level loss to the minimum. However, this is not always preferable but rather disadvantageous from the point of view of reduction in the area of an LSI chip. For this reason, in general, the PMOS is used for transmission of the high voltage while the NMOS is used for transmission of the low voltage. Accordingly, each of switches
13
-
1
through
13
-(2
n
) is made up of the PMOS or NMOS, because the PMOS is hard to transmit the low voltage while the NMOS is hard to transmit the high voltage. Furthermore, resistances
14
and
15
are connected with both ends of serial resistances
12
, respectively, the resistance
14
having the function of lowering the power source voltage VDD and giving the lowered voltage to the serial voltage dividing resistance
12
and the resistance
15
having the function of raising the ground voltage and giving the raised voltage to the serial voltage dividing resistance
12
. The voltage range of the node Nout is determined by these resistances
14
and
15
. Each of resistances
12
is made of polycrystalline silicon (referred to as “poly-silicon” hereinafter) which is hard to be influenced by the other node. All the resistances
12
are formed so as to have an equal resistive value, thereby the less distorted voltage being outputted to the node Nout.
However, the prior art D/A converter as shown in
FIG. 2
included the following problems to be solved.
FIG. 3
is an illustration for showing an example of the layout with respect to the resistance group and the switch group as shown in FIG.
2
.
The layout as shown in
FIG. 3
is obtained by arranging, in a matrix form, a plurality of resistances
31
made of poly-silicon corresponding to the resistances
12
in
FIG. 2 and a
plurality of PMOS′
32
and NMOS′
33
corresponding to switches
13
-
1
through
13
-(2
n
) in
FIG. 2. A
plurality of columns made up of PMOS′
32
are arranged in the region of an N-type well
34
formed on a P-type silicon substrate while a plurality of columns made up of NMOS′
33
are arranged directly on the P-type silicon substrate. Gates
32
g
of PMOS′
32
belonging to one column are interconnected with each other, thereby functioning as a common gate. Gates
33
g
of NMOS′
33
belonging to one column are also interconnected with each other, thereby functioning as a common gate. The column composed of resistances
31
made of poly-silicon is formed so as to intervene between adjacent columns made up of transistors (PMOS′ or NMOS′). Contacts
31
a
and
31
b
are formed such that they are connected with both ends of each resistance
31
, respectively. The contact
31
a
of each resistance
31
and the contact
31
b
of the resistance
31
adjacent thereto are connected with each other through a pattern
31
c
. With this connection, the resistances
31
on one column of the matrix are connected in series with each other. The contact
31
a
of each resistance
31
is connected with the source
32
a
of the PMOS
32
located at the right hand of the resistance
31
or with the drain
33
a
of the NMOS
33
located at the same. The drain
32
b
of the PMOS
32
and the source
33
b
of the NMOS
33
are connected with a pattern
35
, wherein the PMOS
32
and NMOS
33
are on the same row of the matrix and the pattern
35
is provided for every row of the matrix. In case of arranging PMOS′
32
and NMOS′
33
in the matrix form like the above, it is required for two selection switches (not shown) to be additionally provided, that is, one for selecting the gate
32
g
of the PMOS
32
or the gate
33
g
of the NMOS
33
and the other for selecting the pattern
35
. Despite of the addition of these switches, there might be attained a certain advantage from the point of view of reducing the area of the LSI chip.
In case of having actually carried out this matrix arrangement, however, a step portion was created due to a very small height (thickness) difference between the region of the N-type well
34
and the P-type semiconductor substrate region other than the N-type well region. This step portion may affect the refractive index of the light. Therefore, if it is tried to make the semiconductor integrated circuit more compact, in other words, if trying to enhance the degree of integration of the semiconductor integrated circuit, the width of the finished poly-silicon i.e. the finished resistance
31
is made different depending on the place it is formed. Especially, the width of the finished resistance formed in or near the N-type well
34
is considerably made different from that of the formed outside the N-type well region
34
. Difference in the width of the finished resistance
31
makes worse the frequency distortion factor caused in the D/A conversion process. For instance, if the width difference of {fraction (1/100)} is caused between finished resistances
31
, it is considered in general that the frequency distortion factor would be 0.5 per cent.
SUMMARY OF THE INVENTION
In order to solve the problems as have been discussed above, according to the first aspect of the invention, there is provided a D/A converter which is formed on a semiconductor substrate including a plurality of NMOS′ and PMOS′ and converts an input digital data into an analog voltage signal. This D/A converter includes a decoder for decoding the digital data; a voltage setting resistance connecting one end thereof with a power source and outputting, from the other end thereof, a set voltage which is obtained by dropping the voltage outputted by the power source; a plurality of voltage dividing resistances connected in series with each other between the other end of the voltage setting resistance and the ground; a plurality of NMOS′ which are connected between a voltage output node and a plurality of taps provided on a current path made up of the voltage setting
Jean-Pierre Peguy
JeanGlaude Jean Bruner
OKI Electric Industry Co., Ltd.
Volentine & Francos, PLLC
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