Digital testing techniques for very high frequency phase-locked

Details Digital testing techniques for very high frequency phase-locked Digital testing techniques for very high frequency phase-locked

1991-07-18

1994-03-15

Harvey, Jack B.

Boots, shoes, and leggings

324 731, 364481, 364480, G01R 2302

Patent

active

052950794

ABSTRACT:
A digital testing system providing for cost efficient comprehensive testing of very high frequency phase-locked loop performance parameters. The system tests PLL performance parameters both at integrated circuit level and communication board level. Cost efficiency of the testing system allows for volume testing by manufacturers.

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AT&T Advance Data Sheet, "T7351 FDDI Physical Layer Device" Sep. 1990.

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