Digital testing for high-impedance states in digital electronic

Details Digital testing for high-impedance states in digital electronic Digital testing for high-impedance states in digital electronic

1990-11-02

1993-10-26

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 211, 371 212, 365201, G01R 3128, G06F 1100

Patent

active

052569632

ABSTRACT:
Methods for testing digital electronic device terminals to identify high-impedance states from voltage-defined logic states driven by the digital device being tested. For example, the methods can be used to test a memory chip having a three-state signal terminal. The methods allow for detection of high-impedance states without analog voltage testing, such as by using merely a two-state logic testing apparatus. The methods include precharging the signal terminal to a precharge logic state voltage which is different from a selected logic state voltage. The device being tested is stimulated to produce a test signal state at the signal terminal. If the test state is variable between the high-impedance and the selected state, then maintaining the precharge voltage indicates that the signal terminal is in a high-impedance state.

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