Digital test probe having memory for logic levels at different t

Details Digital test probe having memory for logic levels at different t Digital test probe having memory for logic levels at different t

1983-05-26

1986-02-25

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Nonquantitative

324111, G01R 19155, G01R 1067

Patent

active

045730075

ABSTRACT:
The digital test probe has an electrically conductive probe needle for making electrical contact with different test locations of a digital circuit. A logic level detector connected to the needle provides a data signal having a logic level representative of that at the test location. N indicators, such as light emitting diodes, are provided with each presenting an indication of the logic level at an associated one of N test location. A memory has N storage locations and each stores a binary level signal representative of the logic level at an associated one of N test locations. Each time the operator actuates a switch, data representing the logic level at that test location is written into an associated location in the memory. In this way, the operator need not divert his attention from the probing of test locations to look at the indicators while testing the various locations since the indicators will provide him with a visual readout after he has finished.

REFERENCES:
patent: 3525939 (1970-08-01), Cartmell
patent: 3628141 (1971-12-01), Union
patent: 3750015 (1973-07-01), Sheker et al.
patent: 3838339 (1974-09-01), Brandt
patent: 3959791 (1976-05-01), Takahashi et al.
patent: 3999126 (1976-12-01), Gabor
patent: 4011508 (1977-03-01), Gabor
patent: 4145651 (1979-03-01), Ripingill, Jr.
patent: 4189673 (1980-02-01), Shinataku
patent: 4347434 (1982-08-01), Kovalick
French, "Voltmeter With a Memory", Radio and Electronics Constructor, vol. 29, No. 1, pp. 23-25, Aug. 1975.

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