Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-09-18
2007-09-18
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
11081042
ABSTRACT:
A digital signal processor implementation of three algorithms used to detect high impedance faults. The algorithms can be wavelet based, higher order statistics based and neural network based. The algorithms are modified to process one second of data instead of ten seconds of data and a double buffered acquisition is connected to the output of the algorithms.
REFERENCES:
patent: 5475556 (1995-12-01), Yoon et al.
patent: 5485093 (1996-01-01), Russell et al.
patent: 5514965 (1996-05-01), Westwood
patent: 5550751 (1996-08-01), Russell
patent: 5602709 (1997-02-01), Al-Dabbagh
patent: 2093826 (1990-04-01), None
Haj-Maharsi Mohamed Y
Kunsman Steven A.
Nuqui Reynaldo
Peterson John M.
Stoupis James
ABB Research Ltd.
ABB Technology AG
Barlow John
Katterle Paul R.
Khuu Cindy D.
LandOfFree
Digital signal processor implementation of high impedance... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Digital signal processor implementation of high impedance..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Digital signal processor implementation of high impedance... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3773031